Trends in Semiconductor-Machine Learning 2022.2nd sem. #11
Title: Measurement and analysis of qualitative and quantitative defect states in oxide films and devices
Speaker: Professor Jeong Kwon-beom (Dongkuk University)
제목 : 산화막 및 소자의 질적 및 정량적 결함 상태 측정 및 분석
연사 : 정권범 교수(동국대학교)
Date
- Nov 08 2022
- Expired!
Time
- 11:00 am
Organizer
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Department of Physics
Other Organizers
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College of Natural Sciences